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Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach - Microsystems Tomi Laurila 2012 edition
Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach - Microsystems
Tomi Laurila
This book provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials.
218 pages, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2014. gada 22. februāris |
| ISBN13 | 9781447160687 |
| Izdevēji | Springer London Ltd |
| Lapas | 218 |
| Izmēri | 155 × 235 × 15 mm · 317 g |
| Valoda | Angļu |