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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology Adam Foster Softcover reprint of hardcover 1st ed. 2006 edition
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology
Adam Foster
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory.
282 pages, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2010. gada 23. novembris |
| ISBN13 | 9781441923066 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 282 |
| Izmēri | 155 × 235 × 16 mm · 417 g |
| Valoda | Angļu |
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