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Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices Paul Van Der Heide 1. izdevums
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Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices
Paul Van Der Heide
This book serves as a practical reference for anyone involved in any form of Secondary Ion Mass Spectrometry (SIMS). This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications.
384 pages, illustrations
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2014. gada 5. septembris |
| ISBN13 | 9781118480489 |
| Izdevēji | John Wiley & Sons Inc |
| Lapas | 384 |
| Izmēri | 160 × 243 × 24 mm · 657 g |
| Valoda | Angļu |
