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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems - IEEE Press Eishi H. Ibe 1. izdevums
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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems - IEEE Press
Eishi H. Ibe
This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions.
296 pages
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2015. gada 13. februāris |
| ISBN13 | 9781118479292 |
| Izdevēji | John Wiley & Sons Inc |
| Lapas | 296 |
| Izmēri | 175 × 249 × 20 mm · 599 g |
| Valoda | Angļu |
