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Materials Reliability in Microelectronics III: Volume 309 - MRS Proceedings
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Materials Reliability in Microelectronics III: Volume 309 - MRS Proceedings
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
514 pages, black & white illustrations
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2014. gada 5. jūnijs |
| ISBN13 | 9781107409484 |
| Izdevēji | Cambridge University Press |
| Lapas | 514 |
| Izmēri | 152 × 229 × 26 mm · 812 g (Svars (aptuveni)) |
| Valoda | Angļu |
| Redaktors | Filter, William F. |
| Redaktors | Frost, Harold J. (Dartmouth College, New Hampshire) |
| Redaktors | Ho, Paul S. (University of Texas, Austin) |
| Redaktors | Rodbell, Kenneth P. (IBM T J Watson Research Center, New York) |
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