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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics — 2004 - MRS Proceedings
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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics — 2004 - MRS Proceedings
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
422 pages, black & white illustrations
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2014. gada 5. jūnijs |
| ISBN13 | 9781107409224 |
| Izdevēji | Cambridge University Press |
| Lapas | 422 |
| Izmēri | 152 × 229 × 22 mm · 668 g (Svars (aptuveni)) |
| Valoda | Angļu |
| Redaktors | Carter, R. J. |
| Redaktors | Hau-Riege, C. S. |
| Redaktors | Kloster, G. m. |
| Redaktors | Lu, T. -M. (Rensselaer Polytechnic Institute, New York) |
| Redaktors | Schulz, S. E. |
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