Pastāsti draugiem par šo preci:
Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics — 2009: Volume 1156 - MRS Proceedings Martin Gall
Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics — 2009: Volume 1156 - MRS Proceedings
Martin Gall
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
204 pages, black & white illustrations
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2014. gada 5. jūnijs |
| ISBN13 | 9781107408319 |
| Izdevēji | Cambridge University Press |
| Lapas | 204 |
| Izmēri | 152 × 229 × 11 mm · 433 g (Svars (aptuveni)) |
| Valoda | Angļu |
| Redaktors | Gall, Martin |
| Redaktors | Grill, Alfred (IBM T J Watson Research Center, New York) |
| Redaktors | Koike, Junichi (Tohoku University, Japan) |
| Redaktors | Lacopi, Francesca |
| Redaktors | Usui, Takamasa |