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Measurement Techniques for Radio Frequency Nanoelectronics - The Cambridge RF and Microwave Engineering Series T. Mitch Wallis
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Measurement Techniques for Radio Frequency Nanoelectronics - The Cambridge RF and Microwave Engineering Series
T. Mitch Wallis
Understand the fundamentals of radio frequency measurement of nanoscale devices with this practical, cross-disciplinary guide. Featuring numerous examples linking theoretical concepts with real-world applications, it is the ideal resource for researchers in both academia and industry new to the field of radio frequency nanoelectronics.
320 pages, 102 b/w illus. 4 tables
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2017. gada 14. septembris |
| ISBN13 | 9781107120686 |
| Izdevēji | Cambridge University Press |
| Lapas | 328 |
| Izmēri | 178 × 253 × 18 mm · 790 g |
| Valoda | Angļu |
