Pastāsti draugiem par šo preci:
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Advanced Materials Processing and Manufacturing Kumar, Ch Sateesh (University of Johannesburg, South Africa)
Cena
€ 76,99
Pasūtīts no attālās noliktavas
Paredzamā piegāde . gada 7. - 21. sept.
Saņemiet paziņojumus par jauniem Kumar, Ch Sateesh (University of Johannesburg, South Africa) izdevumiem
Mūsu klienti saka:
Pievienot savam iMusic vēlmju sarakstam
Pieejams arī kā:
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Advanced Materials Processing and Manufacturing
Kumar, Ch Sateesh (University of Johannesburg, South Africa)
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
130 pages, 52 Line drawings, black and white; 5 Halftones, black and white; 57 Illustrations, black
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2024. gada 29. novembris |
| ISBN13 | 9781032375113 |
| Izdevēji | Taylor & Francis Ltd |
| Lapas | 130 |
| Izmēri | 234 × 156 × 11 mm · 238 g |
| Valoda | Angļu |
