Yield Simulation for Integrated Circuits - The Springer International Series in Engineering and Computer Science - D.M. Walker - Grāmatas - Kluwer Academic Publishers - 9780898382440 - 1987. gada 30. septembris
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Yield Simulation for Integrated Circuits - The Springer International Series in Engineering and Computer Science 1987 edition

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Since only half the chip area would have redundancy, I was concerned that the increase in yield would not outweigh the increased costs of testing and redundancy programming. I wanted a simulator that would allow me to evaluate the yield of arbitrary redundant layouts, hence I termed such a simulator a layout or yield simulator.


209 pages, biography

Mediji Grāmatas     Hardcover Book   (Grāmata ar cieto muguriņu un vāku)
Izlaists 1987. gada 30. septembris
ISBN13 9780898382440
Izdevēji Kluwer Academic Publishers
Lapas 209
Izmēri 156 × 234 × 14 mm   ·   512 g
Valoda Angļu  

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