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Reliability and Degradation of Iii-v Opt Osamu Ueda
Reliability and Degradation of Iii-v Opt
Osamu Ueda
Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems.
372 pages, 1, black & white illustrations
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 1996. gada 30. septembris |
| ISBN13 | 9780890066522 |
| Izdevēji | Artech House Publishers |
| Lapas | 372 |
| Izmēri | 156 × 234 × 22 mm · 648 g |
| Valoda | Angļu |
Ziemassvētku dāvanas var atgriezt līdz 31. janvārim