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Yield and Reliability in Microwave Circu Michael D. Meehan
Yield and Reliability in Microwave Circu
Michael D. Meehan
A reference for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems.
300 pages, 1, black & white illustrations
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 1993. gada 1. decembris |
| ISBN13 | 9780890065273 |
| Izdevēji | Artech House Publishers |
| Lapas | 300 |
| Izmēri | 152 × 229 × 20 mm · 585 g |