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Microelectronic Reliability: Integrity a Emiliano Pollino
Microelectronic Reliability: Integrity a
Emiliano Pollino
A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi
556 pages, 1, black & white illustrations
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 1989. gada 1. aprīlis |
| ISBN13 | 9780890063507 |
| Izdevēji | Artech House Publishers |
| Lapas | 556 |
| Izmēri | 161 × 235 × 41 mm · 1,09 kg |
| Redaktors | Pollino, Emiliano |