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Microelectronic Manufacturing Yield Reliability and Failure Analysis-25-26 October 1995 Austin Texas Piccoli
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Microelectronic Manufacturing Yield Reliability and Failure Analysis-25-26 October 1995 Austin Texas
Piccoli
284 pages, illustrations
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 1995. gada 31. decembris |
| ISBN13 | 9780819420015 |
| Izdevēji | SPIE Press |
| Lapas | 284 |
| Izmēri | 150 × 220 × 10 mm · 629 g (Svars (aptuveni)) |
![Cover for Michael A. Mueller · Introduction to Confocal Fluorescence Microscopy - Tutorial Texts (Paperback Book) [Second edition] (2005)](https://imusic.b-cdn.net/images/item/original/431/9780819460431.jpg?michael-a-mueller-2005-introduction-to-confocal-fluorescence-microscopy-tutorial-texts-paperback-book&class=scaled&v=1692768712)