Pastāsti draugiem par šo preci:
Multi-chip Module Test Strategies - Frontiers in Electronic Testing Yervant Zorian Reprinted from Journal of Electronic Testing, 10:1 edition
Multi-chip Module Test Strategies - Frontiers in Electronic Testing
Yervant Zorian
This volume of research presents updated test strategies for MCMs. It is designed for engineers interested in practical implementations of MCM test solutions and for designers seeking current test and design-for-testability solutions for their next designs.
167 pages, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 1997. gada 31. maijs |
| ISBN13 | 9780792399209 |
| Izdevēji | Kluwer Academic Publishers |
| Lapas | 167 |
| Izmēri | 203 × 254 × 11 mm · 535 g |
| Valoda | Angļu |
| Redaktors | Zorian, Yervant |