Pastāsti draugiem par šo preci:
Electrical Characterization of Silicon-on-insulator Materials and Devices - the Springer International Series in Engineering and Computer Science Sorin Cristoloveanu 1995 edition
Electrical Characterization of Silicon-on-insulator Materials and Devices - the Springer International Series in Engineering and Computer Science
Sorin Cristoloveanu
Describes a variety of electrical characterization methods, from wafer screening and defect identification to detailed device evaluation. This book provides a comprehensive treatment of different aspects of SOI technologies, including material synthesis, device physics, characterization, circuit applications, and reliability issues.
396 pages, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 1995. gada 30. jūnijs |
| ISBN13 | 9780792395485 |
| Izdevēji | Kluwer Academic Publishers |
| Lapas | 396 |
| Izmēri | 156 × 234 × 22 mm · 734 g |
| Valoda | Angļu |
Ziemassvētku dāvanas var atgriezt līdz 31. janvārim