Pastāsti draugiem par šo preci:
Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard - Frontiers in Electronic Testing Adam Osseiran 1999 edition
Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard - Frontiers in Electronic Testing
Adam Osseiran
Testing of a system does not follow directly from the testing of its parts, and a system built with testable parts can sometimes be impossible to test. Even if all digital chips are compliant with the standard, the testability of a mixed-signal system cannot be guaranteed.
156 pages, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 1999. gada 31. oktobris |
| ISBN13 | 9780792386865 |
| Izdevēji | Springer |
| Lapas | 156 |
| Izmēri | 156 × 234 × 11 mm · 426 g |
| Redaktors | Osseiran, Adam |