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Electrothermal Analysis of VLSI Systems Yi-Kan Cheng 2002 edition
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Electrothermal Analysis of VLSI Systems
Yi-Kan Cheng
This useful book addresses electrothermal problems in modern VLSI systems. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.
210 pages, 36 black & white illustrations, biography
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