Nanolithography: a Borderland Between Stm, Eb, Ib, and X-ray Lithographies - Nato Science Series E: - S Selci - Grāmatas - Kluwer Academic Publishers - 9780792327943 - 1994. gada 30. aprīlis
Ja vāks un nosaukums nesakrīt, pareizs ir nosaukums

Nanolithography: a Borderland Between Stm, Eb, Ib, and X-ray Lithographies - Nato Science Series E:

Cena
€ 202,49

Pasūtīts no attālās noliktavas

Paredzamā piegāde . gada 9. - 19. okt.
Saņemiet paziņojumus par jauniem S Selci izdevumiem
Pievienot savam iMusic vēlmju sarakstam

Not rated yet

Proceedings of the NATO Advanced Research Workshop, Frascati, Roma, Italy, April 6--8, 1993


Marc Notes: Proceedings of the NATO Advanced Research Workshop on Nanolithography: a Borderland Between STM, EB, IB, and X-Ray Lithographies, Frascati, Roma, Italy, April 6-8, 1993--T.p. verso.; Published in cooperation with NATO Scientific Affairs Division.; Includes bibliographical references and indexes. Table of Contents: Preface. Electron Beam Lithography. Nanolithography, the Integrated System; F. J. Hohn. Electron Beam Resists and Pattern Transfer Methods; M. Hatzakis. Nanolithography developed through Electron-Beam-Induced Surface Reaction; S. Matsui, Y. Ochiai, M. Baba, H. Watanabe. Direct Writing of Nanoscale Patterns in SiO2; X. Pan, A. N. Broers. Sub-10 nm Electron Beam Lithography: -AIF-Doped Lithium Fluoride as a Resist; W. Langheinrich, H. Beneking. Surface Imaging for EB-Nanolithography; M. Bottcher, L. Bauch, A. Wolff, W. Hoppner. Patterning of InGaAs/GaAs Quantum Dots Using E-Beam Lithography and Selective Removal of the Top Barrier; A. Schmidt, F. Faller, A. Forchel. Fabrication of Ultrasmall InGaAs/InP Nanostructures by High Voltage Electron Beam Lithography and Wet Chemical Etching; P. Ils, M. Michel, A. Forchel, I. Gyuro, P. Speier, E. Zielinski. Fabrication, Investigation and Manipulation of Artificial Nanostructures; A. Menschig, F. E. Prins, G. Lehr, R. Bergmann, J. Hommel, U. A. Griesinger, V. Harle, F. Scholz, H. Schweizer. Nano-Lithography in 3 Dimensions with Electron Beam Induced Deposition; H. W. P. Koops, M. Rudolph, J. Kretz, M. Weber. Nanolithography Requirements -- an Equipment Manufacturer's View; B. A. Wallman, G. Crawley. X-Ray Lithography. X-Ray Nanolithography: Limits, and Applications to Sub-100 nm Manufacturing; H. I. Smith, M. L. Schattenburg. X-Ray Phase Shifting Masks; F. Cerrina, J. Xiao, Z. Y. Guo. Fabrication of X-Ray Mask for Nanolithography by EBL; M. Gentili. Ion Beam Lithography. Intense Focused Ion Beams for Nanostructurisation; S. Kalbitzer, Ch. Wilbertz, Th. Miller. Latest Results Obtained with the Alpha IonProjection Machine; W. Fallmann, A. Bruckner, E. Cekan, W. Friza, F. Paschke, G. Stangl, F. Thalinger, H. Loschner, G. Stengl, P. Hudek. STM Lithography. Direct Writing with a Combined STM/SEM System; A. L. de Lozanne, W. F. Smith, E. E. Ehrichs. Low Voltage e-Beam Lithography with the Scanning Tunneling Microscope; C. R. K. Marrian, F. K. Perkins, S. L. Brandow, T. S. Koloski, E. A. Dobisz, J. M. Calvert. STM Nanolithography and Characterization of Passivated Silicon and Gallium Arsenide; J. A. Dagata. Sub-20 nm Lithographic Patterning with the STM; L. Stockman, C. Van Haesendonck, G. Neuttiens, Y. Bruynseraede. Lithography of YBa2Cu3O7 Superconducting Thin Films with a Scanning Tunneling Microscope; I. Heyvaert, E. Osquiguil, C. Van Haesendonck, Y. Bruynseraede. Author Index. Subject Index."Publisher Marketing: Success in the fabrication of structures at the nanometer length scale has opened up a new horizon to condensed matter physics: the study of quantum phenomena in confined boxes, wires, rings, and so on. A new class of electronic devices based on this physics has been proposed, with the promise of a new functionality for ultrafast and/or ultradense electronic circuits. Such applications demand highly sophisticated fabrication techniques, the crucial one being lithography.

Mediji Grāmatas     Hardcover Book   (Grāmata ar cieto muguriņu un vāku)
Izlaists 1994. gada 30. aprīlis
ISBN13 9780792327943
Izdevēji Kluwer Academic Publishers
Lapas 228
Izmēri 155 × 235 × 14 mm   ·   503 g
Valoda Angļu  
Redaktors Gentili, Massimo
Redaktors Giovannella, Carlo (Universita Di Roma "Tor Vergata", Italy)
Redaktors Selci, Stefano (Cnr - Istituto Di Struttura Della Materia, Roma, Italy)

Vairāk no tā paša izdevēja

Skatīt visus S Selci