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Semiconductor Memories: Technology, Testing, and Reliability Ashok K. Sharma
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€ 225,99
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Semiconductor Memories: Technology, Testing, and Reliability
Ashok K. Sharma
Provides in depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods, including: memory cell structures and fabrication technologies; application specific memories and architectures; and memory design, fault modeling and test algorithms, limitations, and trade offs.
480 pages, illustrations
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2002. gada 10. septembris |
| ISBN13 | 9780780310001 |
| Izdevēji | John Wiley & Sons Inc |
| Lapas | 480 |
| Izmēri | 183 × 257 × 33 mm · 1,06 kg |
