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Residual Stress Measurement by X-Ray Diffraction SAE International
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Residual Stress Measurement by X-Ray Diffraction
SAE International
This editorial review of J784a is based upon decades of experience in the practical application of x-ray diffraction residual stress measurement methods in thousands of individual applications. J784 is a classic document. It serves as the only recognized standard for residual stress measurement available.
96 pages
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2003. gada 28. februāris |
| ISBN13 | 9780768010695 |
| Izdevēji | SAE International |
| Lapas | 96 |
| Izmēri | 150 × 220 × 10 mm · 197 g (Svars (aptuveni)) |
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