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Electron Microscopy and Analysis 2001 - Institute of Physics Conference Series 1. izdevums
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Electron Microscopy and Analysis 2001 - Institute of Physics Conference Series
Electron microscopy is a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. This book presents a useful snapshot of the developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies.
529 pages, Illustrations
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2001. gada 1. decembris |
| ISBN13 | 9780750308120 |
| Izdevēji | Taylor & Francis Ltd |
| Lapas | 529 |
| Izmēri | 163 × 242 × 36 mm · 940 g |
| Valoda | Angļu |
| Redaktors | Aindow, M. (University of Connecticut, USA) |
| Redaktors | Kiely, C. J. (Department of Engineering, University of Liverpool, UK) |
