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Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy Chim, Wai Kin (National University of Singapore)
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Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy
Chim, Wai Kin (National University of Singapore)
Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits.
288 pages, Illustrations
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2000. gada 13. decembris |
| ISBN13 | 9780471492405 |
| Izdevēji | John Wiley & Sons Inc |
| Lapas | 288 |
| Izmēri | 160 × 237 × 20 mm · 716 g |
