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Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications Greg Haugstad
Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
Greg Haugstad
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM).
488 pages, Illustrations
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2012. gada 16. oktobris |
| ISBN13 | 9780470638828 |
| Izdevēji | John Wiley & Sons Inc |
| Lapas | 528 |
| Izmēri | 163 × 244 × 31 mm · 794 g |
| Valoda | Angļu |
Skatīt visus Greg Haugstad ( piem., Hardcover Book )