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Applied Charged Particle Optics: Part II - Advances in Imaging and Electron Physics
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Applied Charged Particle Optics: Part II - Advances in Imaging and Electron Physics
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2026. gada 24. septembris |
| ISBN13 | 9780443471124 |
| Izdevēji | Elsevier Science Publishing Co Inc |
| Lapas | 252 |
| Izmēri | 150 × 220 × 20 mm · 450 g |
| Sērijas redaktors | Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) |
| Sērijas redaktors | Hytch, Martin (Senior Scientist, French National Centre for Research (CNRS), Toulouse, France) |
