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Digital Integrated Circuit Testing from a Quality Perspective Eugene R. Hnatek 1993 edition
Digital Integrated Circuit Testing from a Quality Perspective
Eugene R. Hnatek
Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a
180 pages, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 1993. gada 31. augusts |
| ISBN13 | 9780442006433 |
| Izdevēji | Kluwer Academic Publishers Group |
| Lapas | 180 |
| Izmēri | 156 × 234 × 12 mm · 476 g |
| Valoda | Angļu |
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