Pastāsti draugiem par šo preci:
Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation 1. izdevums
Cena
€ 97,49
Pasūtīts no attālās noliktavas
Paredzamā piegāde . gada 14. - 28. aug.
Mūsu klienti saka:
Pievienot savam iMusic vēlmju sarakstam
Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation
Neutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the
368 pages
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2020. gada 30. jūnijs |
| ISBN13 | 9780367446802 |
| Izdevēji | Taylor & Francis Ltd |
| Lapas | 368 |
| Izmēri | 150 × 220 × 10 mm · 680 g |
| Valoda | Angļu |
| Redaktors | Fitzpatrick, M.E. |
| Redaktors | Lodini, Alain |
