Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, - Lawrence E. Murr - Grāmatas - Taylor & Francis Ltd - 9780367402945 - 2019. gada 29. oktobris
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Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, 2. izdevums

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The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr


856 pages

Mediji Grāmatas     Paperback Book   (Grāmata ar mīksto vāku un līmēto muguru)
Izlaists 2019. gada 29. oktobris
ISBN13 9780367402945
Izdevēji Taylor & Francis Ltd
Lapas 856
Izmēri 150 × 220 × 10 mm   ·   453 g
Valoda Angļu  
Redaktors Murr, Lawrence E

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