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Advances in Imaging and Electron Physics Peter Hawkes
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Advances in Imaging and Electron Physics
Peter Hawkes
Advances in Imaging and Electron Physics, Volume 224 highlights new advances in the field, with this new volume presenting interesting chapters on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods, Development of an alternative global method with high angular resolution, Implementing the new global method, Numerical validation of the method and influence of optical distortions, and Applications of the method.
232 pages
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2022. gada 25. augusts |
| ISBN13 | 9780323988636 |
| Izdevēji | Elsevier Science & Technology |
| Lapas | 266 |
| Izmēri | 150 × 220 × 20 mm · 526 g |
| Valoda | Angļu |
| Redaktors | Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) |
| Redaktors | Hytch, Martin (Senior Scientist, French National Centre for Research (CNRS), Toulouse, France) |
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