Pastāsti draugiem par šo preci:
High Resolution Focused Ion Beams: Fib and Its Applications: the Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology Jon Orloff 2002 Edition
High Resolution Focused Ion Beams: Fib and Its Applications: the Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology
Jon Orloff
Suitable for both the user and the designer of FIB instrumentation, this book focuses on high resolution focused ion beams (FIBs).
304 pages, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2002. gada 31. oktobris |
| ISBN13 | 9780306473500 |
| Izdevēji | Springer Science+Business Media |
| Lapas | 304 |
| Izmēri | 155 × 235 × 20 mm · 589 g |
| Valoda | Angļu |
Ziemassvētku dāvanas var atgriezt līdz 31. janvārim