Pastāsti draugiem par šo preci:
Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization A W Czanderna 2002 edition
Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization
A W Czanderna
The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.
430 pages, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 1998. gada 31. oktobris |
| ISBN13 | 9780306458965 |
| Izdevēji | Springer Science+Business Media |
| Lapas | 430 |
| Izmēri | 156 × 234 × 25 mm · 811 g |
| Redaktors | Czanderna, Alvin W. |
| Redaktors | Madey, Theodore E. |
| Redaktors | Powell, Cedric J. |