Pastāsti draugiem par šo preci:
Principles of Analytical Electron Microscopy Goldstein Joseph 1986 edition
Principles of Analytical Electron Microscopy
Goldstein Joseph
All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.
448 pages, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 1986. gada 31. jūlijs |
| ISBN13 | 9780306423871 |
| Izdevēji | Springer Science+Business Media |
| Lapas | 448 |
| Izmēri | 156 × 234 × 26 mm · 830 g |
| Valoda | Angļu |
| Redaktors | Goldstein, Joseph |
| Redaktors | Joy, David C. |
| Redaktors | Romig Jr., Alton D. |