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Advanced Scanning Electron Microscopy and X-Ray Microanalysis Patrick Echlin 1986 edition
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.
454 pages, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 1986. gada 31. marts |
| ISBN13 | 9780306421402 |
| Izdevēji | Springer Science+Business Media |
| Lapas | 454 |
| Izmēri | 156 × 234 × 27 mm · 721 g |
| Valoda | Angļu |
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