Defect and Microstructure Analysis by Diffraction - International Union of Crystallography Monographs on Crystallography - Robert L. Snyder - Grāmatas - Oxford University Press - 9780198501893 - 2000. gada 16. marts
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Defect and Microstructure Analysis by Diffraction - International Union of Crystallography Monographs on Crystallography

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€ 490,99

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Paredzamā piegāde . gada 27. aug. - . gada 10. sept.
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Examines the state of the art for determining the "real" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray diffraction.


808 pages, numerous line figures

Mediji Grāmatas     Hardcover Book   (Grāmata ar cieto muguriņu un vāku)
Izlaists 2000. gada 16. marts
ISBN13 9780198501893
Izdevēji Oxford University Press
Lapas 808
Izmēri 164 × 238 × 49 mm   ·   1,30 kg
Valoda Angļu  
Redaktors Bunge, Hans J (Department of Physical Metallurgy, Department of Physical Metallurgy, Technical University of Clausthal, Germany)
Redaktors Fiala, Jaroslav (Department of Metallurgy, Department of Metallurgy, Central Research Institute Skoda, Czech Republic)
Redaktors Snyder, Robert (, Department of Materials Science and Engineering, Columbus, USA)

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