Monte Carlo Modeling for Electron Microscopy and Microanalysis - Oxford Series in Optical and Imaging Sciences - Joy, David C. (Director, Electron Microscope Facility, Director, Electron Microscope Facility, University of Tennessee) - Grāmatas - Oxford University Press Inc - 9780195088748 - 1995. gada 15. jūnijs
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Joy, David C. (Director, Electron Microscope Facility, Director, Electron Microscope Facility, University of Tennessee)
Monte Carlo Modeling for Electron Microscopy and Microanalysis - Oxford Series in Optical and Imaging Sciences

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This book is a practical guide to the use of Monte Carlo simulation techniques for the study of electron solid interactions in the electron microscope. Programs, optimized for use on personal computers, are developed to deal with typical applications including secondary, and back- scattered, electron imaging. EBIC imaging of semiconductors and X-ray microanalysis.

224 pages, line figures, tables

Mediji Grāmatas     Hardcover Book   (Grāmata ar cieto muguriņu un vāku)
Izlaists 1995. gada 15. jūnijs
ISBN13 9780195088748
Izdevēji Oxford University Press Inc
Lapas 224
Izmēri 234 × 156 × 14 mm   ·   499 g
Valoda Angļu  

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