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Advances in Imaging and Electron Physics Peter W. Hawkes 165 edition
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Advances in Imaging and Electron Physics
Peter W. Hawkes
Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
360 pages
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2013. gada 7. februāris |
| ISBN13 | 9780124076709 |
| Izdevēji | Elsevier Science Publishing Co Inc |
| Lapas | 360 |
| Izmēri | 150 × 220 × 20 mm · 680 g |
| Sērijas redaktors | Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) |
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