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Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles - Advances in Imaging and Electron Physics
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Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles - Advances in Imaging and Electron Physics
Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in these domains.
752 pages
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2011. gada 21. jūnijs |
| ISBN13 | 9780123813107 |
| Izdevēji | Elsevier Science Publishing Co Inc |
| Lapas | 752 |
| Izmēri | 152 × 229 × 40 mm · 1,17 kg |
| Valoda | Angļu |
| Sērijas redaktors | Hawkes, Peter W. (Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics) |
