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Reliability and Failure of Electronic Materials and Devices Ohring, Milton (Stevens Institute of Technology, Hoboken, NJ, USA (Retired)) 2. izdevums
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€ 191,99
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Reliability and Failure of Electronic Materials and Devices
Ohring, Milton (Stevens Institute of Technology, Hoboken, NJ, USA (Retired))
Offers coverage of some of the major topics related to the performance and failure of materials used in electronic devices and electronics packaging. This book explains the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects and radiation damage.
758 pages, colour illustrations
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2014. gada 1. decembris |
| ISBN13 | 9780120885749 |
| Izdevēji | Elsevier Science Publishing Co Inc |
| Lapas | 758 |
| Izmēri | 165 × 232 × 46 mm · 1,17 kg |
| Valoda | Angļu |
