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Failure Analysis: High Technology Devices - De Gruyter STEM Daniel J. D. Sullivan
Failure Analysis: High Technology Devices - De Gruyter STEM
Daniel J. D. Sullivan
The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
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| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2022. gada 24. oktobris |
| ISBN13 | 9781501524783 |
| Izdevēji | De Gruyter |
| Lapas | 128 |
| Izmēri | 150 × 220 × 10 mm · 238 g |
| Valoda | Angļu |